2019 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN)
- April 2, 2019 - April 4, 2019
- Monterey Marriott in Monterey, CA, US
The FCMN will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, and manufacturing. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference will summarize major issues and provided critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nanoelectronics and beyond.
Join us -
“AI and Machine Learning for Advanced Semiconductor Metrology and Process Control”
Speaker: Shay Wolfling, PhD, Chief Technology Officer, Nova