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Events and Presentations

Advanced Process Control Conference (APC) XXX 2018

  • 08-10-2018
  • Hilton Austin Airport, TX, USA

The Advanced Process Control Conference (APC) will address APC needs and solutions for the semiconductor and related industries that also require high precision manufacturing. The conference is built around tutorials, technical presentations, poster sessions, and exhibits. The Integrated Measurement Association (IMA) underwrites and organizes this event. This year will be the 30th annual meeting of this conference.

Join us -

“Machine Learning methods and Big Data in optical metrology for process control”.

Speaker: Barak Bringoltz, PhD, Director of Modeling, Nova

“Machine-learning based on process parameters”

Speaker: Noam Tal, Algorithm Expert, Nova