Events and Presentations


  • 18-10-2018
  • Xiamen, China
IWAPS provides a forum for the experts from industry and research institutions worldwide to present and discuss advanced pattering solutions and related challenges such as material, equipment, process, metrology, computational lithography and design optimization. The speakers at the workshop are selected by invitation only and represent a broad range of disciplines and covering a wide array of different lithography approaches and requirements. Join us - “Metrology using machine learning” Speaker: Barak Bringoltz, PhD, Director of Modeling, Nova