Masters of Disruptive Thinking and Innovative Technologies
Nova’s state-of-the-art metrology solutions are based on multiple advanced technologies in various fields of expertise, including Optical Scatterometry, x-ray photoelectron spectroscopy (XPS), x-ray fluorescence (XRF), scatterometry modeling software and high-performance computing.
Dimensional MetrologyIntegrated and Stand-alone optical platforms for CD and thin films measurementsExplore Technologies >
Materials MetrologyInline XPS and XRF platforms for composition and film thickness measurementsExplore Technologies >
Chemical MetrologyPower up your process control with proven flexible architecture solutions supporting the largest variety of instruments and numerous analysis techniques that are installed together for maximal performance.Explore Technologies >
Software ModelingAdvanced modeling solutions empowered by physical and machine learning algorithmsExplore Technologies >
Fostering Partnership to Enable Tomorrow’s Technologies
Nova partners with leading customer R&D centers, academies and research institutes to co-develop innovative process control solutions for next generations’ logic and memory technologies such as FinFET, Nanowires, 3D-NAND and emerging memory technologies.