Join a lecture by imec’s Janusz Bogdanowicz about: “Three-dimensional gate-all-around semiconductor devices: a new realm for metrology” in the Advanced Characterization of Materials session on May 30 at 8:45.
Our Research Scientist, Yovav Kalifon, will hold a lecture about: Raman Spectroscopy Machine-Learning Approach for Inline Application in the Semiconductor Industry, on May 28 at 09:45.