Revolutionizing inline materials metrology, the Nova VERAFLEX® LE-XRF product line is the industry standard for combined XPS and low energy XRF (LE-XRF) materials characterization. The most recent addition to the product line, Nova VERAFLEX® IV LE-XRF addresses critical industry challenges across all device market segments. Significantly increasing X-ray flux at the measurement site for higher precision and throughput, this next-generation solution continues to extend the market leadership of the Nova VERAFLEX® LE-XRF product line.
Why VERAFLEX® IV LE-XRF
New material integration strategies continue to drive critical device performance improvements for advanced FinFet, Nanosheets, and novel memory structures. The VeraFlex IV LE-XRF provides the highest X-ray flux available to deliver the speed, sensitivity, and flexibility necessary to enable these performance breakthroughs.