X-Ray Fluorescence (XRF)
The Nova VERAFLEX® XF product line is equipped with unique, low-energy XRF capabilities. Both XPS and XRF signals are measured simultaneously from the same incident X-ray source.
Why XRF?
XRF technology provides an additional channel of elemental information based on analysis of secondary electron X-ray emissions from the sample.
How it Works?
The photoelectric effect can impact additional interactions of light and matter. The removal of an inner shell electron resulting from an energetic incident X-ray renders electronic structure instability for the analyzed material. Since each element has electronic orbitals of characteristic energies, there is a finite number of ways in which the unstable vacancy can be filled. If it is filled by a higher shell electron, the difference in shell energy is released as a photon (i.e. X-ray). Analysis of this secondary X-ray emission, or X-ray fluorescence, is known as XRF.
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