Titration

Nova’s chemical metrology products leverage titration, a quantitative analysis method for measuring the concentration of components in liquids. Titration has been improved constantly since its introduction many years before, making it a well-established technique and one of today’s most popular methods worldwide. Modern titration techniques are fully automated and use high-precision dispensing devices, sensitive probes, and intelligent algorithms for analysis execution and evaluation.

Titration‎‎ diagram

Highlights and Benefits

Calibration-Free

High Accuracy

Multiple Variations

High Adaptability

Multiple Sensors

Calibration-Free

High Accuracy

Multiple Variations

High Adaptability

Multiple Sensors

Calibration-Free

Titration is an absolute analysis technique that requires no calibration

High Accuracy

Executed using a high-precision dispensing device and sensitive, optimized for the analyte probe that leverages an extremely accurate and linear analytic technique to ensure outstanding accuracy and repeatability

Multiple Variations

Offers a range of options given its large array of available chemical reactions, types of detection, probe kinds and materials

High Adaptability

Easily adapts to varied concentrations of titrant, sample volume and dosing parameters

Multiple Sensors

Equipped with a wide range of maintenance-free sensors (e.g. pH, redox, ion-selective, color)

Titration

The titration process requires a defined chemical reaction, a sensor that monitors the reaction, and stable titration reagents (titrants). The analyte, a well-defined, accurate volume of the sample containing the component to be measured, is initially placed in a vessel equipped with a stirrer and the sensor. The titrants are dispensed stepwise while being constantly stirred. The signal from the sensor is continuously recorded to determine the end of the chemical reaction, known as the equivalence point or endpoint. The volume and concentration of the titrant required to reach the endpoint is then used to calculate the component concentration.

 

You Might Also Be Interested In

Demonstrating a DNA of InNOVAtion

There are Infinite ways to innovate and Nova is known to cultivate an atmosphere of innovation, enc...

How Did the Name Kaufman Turn into a Synonym to InNOVAtion a...

At Nova, 'Kaufman', became a synonym for innovation and groundbreaking ideas. So, you would hear peo...

Nova– a Journey of Innovation

At Nova, a leading semiconductor metrology provider, innovation is a top value both as a strategy a...

Press Releases

ancosys Chemical Metrology Solution Selected by Additional Front-End Customer

ancosys Chemical Metrology Solution Selected by Additional Front-End Customer

09 Feb, 2022
Read More
Nova Expands Into Advanced Chemical Metrology With ancosys Acquisition

Nova Expands Into Advanced Chemical Metrology With ancosys Acquisition

16 Nov, 2021
Read More
Nova Completes Acquisition of ancosys

Nova Completes Acquisition of ancosys

25 Jan, 2022
Read More
IBM Research and Nova Jointly Awarded the “Best Metrology Paper” at SPIE Advanced Lithography Conference

IBM Research and Nova Jointly Awarded the “Best Metrology Paper” at SPIE Advanced Lithography Conference

26 Apr, 2022
Read More

Our Publications

Filter By Years
2023
2022
2021
2020
2019
Authored by: Daniel Doutt*a, Ping-ju Chena, Bhargava Ravooria, Tuyen K. Trana, Eitan Rothsteinb, Nir Kampelb, Lilach Tamamb, Effi Aboodyb, Avron Gerb, Harindra Vedalac
TSV stress evolution mapping using in-line Raman spectroscopy
April 27 2023
@
SPIE Advanced Lithography + Patterning
Authored by: Stefan Schoeche, Daniel Schmidt, Marjorie Cheng, Aron Cepler, Abraham Arceo de la Pena, Jennifer Oakley
Authored by: A. Moussa, J. Bogdanowicz, B. Groven, P. Morin, M. Beggiato, M. Saib, G. Santoro, Y. Abramovitz, K. Houtchens, S. Ben Nissim, N. Meir, J. Hung, A. Urbanowicz, R. Koret, I. Turovets, G. F. Lorusso, A.-L. Charley
Authored by: Benjamin Hickey, Wei Ti Li, Sarah Okada, Lawrence Rooney, Feng Zhang
Authored by: Benjamin Hickey, Wei Ti Li, Sarah Okada, Lawrence Rooney, Feng Zhang
Authored by: Julia Hoffman, Sarah Okada, Lawrence Rooney, Bruno Schueler, Ganesh Vanamu