Measure the Invisible to Provide Deep Process Insight
Nova offers a comprehensive suite of dimensional, materials, and chemical metrology solutions combined with advanced modeling and machine learning. These enable semiconductor manufacturers to gain deeper insight throughout the production process, increase yield, and shorten time to market.
Translate Metrology Data
into Concise Insight
In-Line Materials Metrology for Semiconductor Manufacturing
Rich, Industry-Standard
Chemical Analysis
Pursuing Insights to
Simplify Complex Problems
Global support services dedicated to your sucess
Nova’s Global Services is structured to support you through a product’s lifecycle, guide you towards your goal of achieving and maintaining high-quality yields, and meeting special metrology requirements
