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20-F 2020

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Raman Based Metrology for Leading-Edge Semiconductor Nodes

Over the recent years, a revolution is brewing in the semiconductor industry. The long-standing trend of transistor density increase and performance-per-watt improvements, described by Moore’s law and Dennard scaling, are now facing fundamental physical limits. However, this crisis has led to a flurry of innovation and revolutionary new approaches for semiconductor design and operating principles, […]

A Mountain Climber, a Physics PHD, an Inspiration to Women- ...

Julia Hoffman, PhD, is an Algorithm Technologist in our material’s metrology division. Julia loves writing algorithms, but she also loves the variety that her position enables. In our conversation, Julia shares her superpower, what attracted her to Nova, and her best advice for young women who want to pursue science and a corporate career. What’s […]