Home Blog

20-F 2021

Related Articles

The Best of Both Worlds: When Professional growth Meets Frie...

Keily and Rachel were both excited to join the Nova team and work with cutting-edge technologies. Starting on the same day, they also found themselves in the same workspace, which sparked a friendship that has made working together even more rewarding. Can you both tell us a bit about your journeys before joining Nova? Keily: […]

Ion Implantation Applications for In-Line SIMS Metrology

Ion implantation is a key process in the semiconductor industry but can be impacted by various factors. The article suggests using in-line Secondary Ion Mass Spectroscopy (SIMS) to improve implant process control and meet demand for consistent implantation materials by measuring peak concentration, peak depth, and dose simultaneously. Abstract In the semiconductor industry, ion implantation […]