Nova Introduces Nova METRION®- our New in-line SIMS Product...
Dr. Shay Wolfling, Nova's CTO is proud to introduce the Nova METRION®- our new in-line SIMS product and technology. Click Play to watch the webinar Hello to you all, In this short online Webinar, I want to introduce the Nova METRION®– our new in-line SIMS product and technology. The webinar will include a short overview […]
Dr. Shay Wolfling
8 Dec, 2021
Nova METRION®: Analyzing Materials Composition of Complex S...
Nova METRION® directly measures the composition of wafer materials using Secondary Ion Mass Spectrometry (SIMS). METRION performs SIMS measurements in-line on full 300mm product wafers with complex film stacks for both logic and memory devices. Performing these measurements in the semiconductor fab, rather than in a cost-and-time intensive laboratory setting, provides faster results, which reduces […]
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