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Q1 2022

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Raman Based Metrology for Leading-Edge Semiconductor Nodes

Over the recent years, a revolution is brewing in the semiconductor industry. The long-standing trend of transistor density increase and performance-per-watt improvements, described by Moore’s law and Dennard scaling, are now facing fundamental physical limits. However, this crisis has led to a flurry of innovation and revolutionary new approaches for semiconductor design and operating principles, […]

Nova Introduces Nova METRION®- our New in-line SIMS...

Dr. Shay Wolfling, Nova's CTO is proud to introduce the Nova METRION®- our new in-line SIMS product and technology. Click Play to watch the webinar Hello to you all, In this short online Webinar, I want to introduce the Nova METRION®– our new in-line SIMS product and technology. The webinar will include a short overview […]