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Q3 2020

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Dr. Daphna Peimer- Dancing with Particles of Success

Dr. Daphna Peimer is an algorithm developer at Nova since 2015. Had she not turned to engineering, she would probably have been a dancer. Still, she chose the academic route, leading to a Ph.D., based on extensive research of a new and long-lived elementary particle. Despite her busy schedule, we managed to catch Dr. Daphna […]

Ion Implantation Applications for In-Line SIMS Metrology

Ion implantation is a key process in the semiconductor industry but can be impacted by various factors. The article suggests using in-line Secondary Ion Mass Spectroscopy (SIMS) to improve implant process control and meet demand for consistent implantation materials by measuring peak concentration, peak depth, and dose simultaneously. Abstract In the semiconductor industry, ion implantation […]