Ion Implantation Applications for In-Line SIMS Metrology
Ion implantation is a key process in the semiconductor industry but can be impacted by various factors. The article suggests using in-line Secondary Ion Mass Spectroscopy (SIMS) to improve implant process control and meet demand for consistent implantation materials by measuring peak concentration, peak depth, and dose simultaneously.
Nova– a Journey of Innovation
At Nova, a leading semiconductor metrology provider, innovation is a top value both as a strategy and as a daily practice. In an exclusive interview, the company's CTO, Dr. Shay Wolfling, shares how this concept provides a unique competitive advantage in the rapidly changing chip market.
How Did the Name Kaufman Turn into a Synonym to InNOVAtion at Nova?
At Nova, 'Kaufman', became a synonym for innovation and groundbreaking ideas. So, you would hear people in conversation at Nova saying: "wow, that's a Kaufman!" Like saying: "great out-of-the-box thinking". When someone says: "This is a Kaufman Idea" they actually mean: "Great job!"