Join us on FCMN 2026 for the following sessions:
Wednesday, March 18, Sarah Okada (Nova) | Invited Oral Talk
Inline Metrologies II Technical Session
9:30 – 10:00 AM Impact Assessment of In-Line SIMS Utilization on Logic Device Performance
Dr. Kitty Kumar (Intel) & Ganesh Vanamu (Nova) | Poster Session
Inline XPS and Raman Metrology for Evaluating Graphene Integrity During Thin Film Deposition