Join Michael Shifrin, Nova’s Software Solutions Product Marketing Director, on his talk about: Implementation of Machine Learning in Advanced Pattern
Process Control Metrology

Join Daniel Fishman, Nova’s Product Manager in the DMD on his talk about: Early Fault-Analysis Using In-Line RAMAN Spectroscopy

Join Ovadia Ilgayev. Nova’s Product Manager in the Dimensional Metrology Division on his talk about: AI Innovations in Integrated Metrology

Join Nova’s Short Course: Metrology and material characterization for the era of 3D Logic and Memory

Join Daniel Fishman, Product Manager at Nova’s Dimensional Metrology Division in his talk about: A new vibe in material metrology – Raman spectroscopy

Join Eitan Oppenhaim, Nova’s President and Chief Executive Officer and Dror David, Chief Financial Officer, who will present at the 24th Needham Virtual Growth Conference on January 11th, 2022 at 9:15am EST.

Join Roy Shtainman, VP Product Marketing in his talk about: Spectral interferometry usage for advanced vertical integrations manufacturing process

Join Sang Hyun Han, Nova’s VP Strategic Marketing in his lecture about: A New Paradigm of Process Control Solutions for Advanced Semiconductor DevicesMonterey, California