Join Eitan Oppenhaim, Nova’s President and Chief Executive Officer and Dror David, Chief Financial Officer, who will present at the 24th Needham Virtual Growth Conference on January 11th, 2022 at 9:15am EST.

Join Roy Shtainman, VP Product Marketing in his talk about: Spectral interferometry usage for advanced vertical integrations manufacturing process

Join Sang Hyun Han, Nova’s VP Strategic Marketing in his lecture about: A New Paradigm of Process Control Solutions for Advanced Semiconductor DevicesMonterey, California

Join Nova’s Sarah Okada, Sr. Product Manager, for a presentation about: Gate-All-Around Presents New Metrology Challenges and Opportunities

Join us in the 3rd Annual Needham Virtual Semiconductor and SemiCap 1×1 Conference
We will hold virtual one-on-one meetings, on Wednesday, Aug. 24 and Thursday, Aug. 25

One-on-one meeting requests can be made by contacting your Needham representative

In-person with Eitan Oppenhaim, CEO & President

Thursday, September 8th, at the Westin New York at Times Square. Fireside chat with Nova CEO & President is planned for 3:00 pm EDT on the same day.

Join Ilya Osherov, Nova’s Product Marketing Director, in his talk about: Spectral interferometry and VTS technology for advanced nodes manufacturing process metrology, in the Semiconductor Advanced Inspection and Metrology Forum. Click here to Join the forum: https://www.semicontaiwan.org/en/semiconductor-advanced-inspection-and-metrology%20-forum

Join Dr. Irene Popova, Nova’s CMD VP of Technology in her presentation: Increased use of chemical process control taking as a path to increased sustainability

Join Omry Pinhasi Nova’s Product Marketing Manager in his talk about: AI and machine learning algorithms to fast optical material metrology tools