Join Dror David Nova’s CFO and Guy Kizner VP of corporate finance and incoming CFO Click to Join the WebCast: https://wsw.com/webcast/stifel89/nvmi/2120944 [wsw.com]
Join our Sang Hyun Han, VP Strategic Marketing, on Aug 12 at 10 AM, Suwon Convention Center, for ‘The Metrology Trend to the Challenges of Future Devices.’
Join our Product Marketing Director, Sarah Okada for an enlightening presentation about: In-line SIMS: A Key Tool for Characterizing Epitaxy Processes in Nanosheet Device Fabrication
Join us, click here to sign up: https://www.semi.org/en/connect/events/strategic-materials-conference-smc
ECTC – IEEE Electronic Comnents and Technology Conference
Denver, Colorado, May 28 – 31, 2024, Booth #438
To attend the conference call, please dial one of the following numbers at least five minutes before the conference call commences. If you are unable to connect using the toll-free numbers, please try the international dial-in number.
U.S. TOLL-FREE: 1-833-816-1427
ISRAEL TOLL-FREE: 1-80-9213284
INTERNATIONAL: 1-412-317-0519
WEBCAST LINK: https://event.choruscall.com/mediaframe/webcast.html?webcastid=PrIE3UQQ
At:
8:30 a.m. Eastern Time
5:30 a.m. Pacific Time
3:30 p.m. Israel Time
The conference call will also be available via a live webcast from a link on Nova’s Investor Relations website – https://www.novami.com/investors/events/. A replay of the conference call will be available from May 9, 2024 to May 16, 2024. To access the replay, please dial one of the following numbers:
Replay TOLL-FREE: 1-877-344-7529
Replay TOLL/INTERNATIONAL: 1-412-317-0088
Replay Pin Number: 6529075
Times
8:30 a.m. Eastern Time
Dial-In Number
U.S. TOLL-FREE: 1-833-816-1427
ISRAEL TOLL-FREE: 1-80-9213284
INTERNATIONAL: 1-412-317-0519
Webcast Link
Disclaimer
Press release
Join the lecture by Infinion about: Usage of OCD with ML for deep trenches depth and bottom CD
Join a lecture by imec’s Janusz Bogdanowicz about: “Three-dimensional gate-all-around semiconductor devices: a new realm for metrology” in the Advanced Characterization of Materials session on May 30 at 8:45.
Our Research Scientist, Yovav Kalifon, will hold a lecture about: Raman Spectroscopy Machine-Learning Approach for Inline Application in the Semiconductor Industry, on May 28 at 09:45.
Join our Materials Metrology Division General Manager, Adrian Wilson for a lecture on: “The use of Artificial Intelligence and Machine learning in soft X-ray technology for Advanced Semiconductor Process Development and Control”
Join Dr. Shay Wolfling, Nova’s CTO in his insightful lecture about: Advanced and future logic device architectures: challenges and solutions in materials metrology
April 17 | 16:00
Join us in an enlightening lecture by our own John Mc Manus, NOva’s application engineer, about: Enabling Higher Resolution Measurement to Support Zone Control .
The lecture will take place on April 16th at 2:00 PM