To attend the conference call, please dial one of the following numbers at least five minutes before the conference call commences. If you are unable to connect using the toll-free numbers, please try the international dial-in number.
U.S. TOLL-FREE: 1-833-816-1427
ISRAEL TOLL-FREE: 1-80-9213284
INTERNATIONAL: 1-412-317-0519
WEBCAST LINK: https://event.choruscall.com/mediaframe/webcast.html?webcastid=PrIE3UQQ
At:
8:30 a.m. Eastern Time
5:30 a.m. Pacific Time
3:30 p.m. Israel Time
The conference call will also be available via a live webcast from a link on Nova’s Investor Relations website – https://www.novami.com/investors/events/. A replay of the conference call will be available from May 9, 2024 to May 16, 2024. To access the replay, please dial one of the following numbers:
Replay TOLL-FREE: 1-877-344-7529
Replay TOLL/INTERNATIONAL: 1-412-317-0088
Replay Pin Number: 6529075
Times
8:30 a.m. Eastern Time
Dial-In Number
U.S. TOLL-FREE: 1-833-816-1427
ISRAEL TOLL-FREE: 1-80-9213284
INTERNATIONAL: 1-412-317-0519
Webcast Link
Disclaimer
Press release
Join the lecture by Infinion about: Usage of OCD with ML for deep trenches depth and bottom CD
Join a lecture by imec’s Janusz Bogdanowicz about: “Three-dimensional gate-all-around semiconductor devices: a new realm for metrology” in the Advanced Characterization of Materials session on May 30 at 8:45.
Our Research Scientist, Yovav Kalifon, will hold a lecture about: Raman Spectroscopy Machine-Learning Approach for Inline Application in the Semiconductor Industry, on May 28 at 09:45.
Join our Materials Metrology Division General Manager, Adrian Wilson for a lecture on: “The use of Artificial Intelligence and Machine learning in soft X-ray technology for Advanced Semiconductor Process Development and Control”
Join Dr. Shay Wolfling, Nova’s CTO in his insightful lecture about: Advanced and future logic device architectures: challenges and solutions in materials metrology
April 17 | 16:00
Join us in an enlightening lecture by our own John Mc Manus, NOva’s application engineer, about: Enabling Higher Resolution Measurement to Support Zone Control .
The lecture will take place on April 16th at 2:00 PM
U.S. TOLL-FREE: 1-833-816-1427 ISRAEL TOLL-FREE: 1-80-9213284 INTERNATIONAL: 1-412-317-0519 At: Join Dr. Roy Pinhassi, Product Marketing Manager, in his insightful lecture: Doping level detection in Si or SiGe via In-Line Raman Spectroscopy. Unique spectral interferometry solutions for complex high aspect ratio 3D NAND structures (12955-60) Spectral interferometry for TSV metrology in chiplet technology (12955-56)
WEBCAST LINK: https://event.choruscall.com/mediaframe/webcast.html?webcastid=XbNPrv6u
8:30 a.m. Eastern Time
5:30 a.m. Pacific Time
3:30 p.m. Israel TimePress Release
Session 12 | Jaesuk Yoon, SAMSUNG (Korea)
29 February, 4:00 PM
Session 11 | Stefan Schoeche, IBM (USA)
29 February, 2:10 PM
From lab to fab: In-line SIMS for process control in Nanosheet Gate-All-Around device manufacturing (12955-7)
Session 2 | Stefan Schoeche, IBM (USA)
26 February, 4:30 PM
On-cell thickness monitoring of chalcogenide alloy layer using spectral interferometry, Raman spectroscopy, and hybrid machine learning (12955-14)
Session 3 | Hyunwoo Ryoo, SAMSUNG (Korea)
27 February, 11:20 AM