Join Daniel Fishman, Product Manager at Nova’s Dimensional Metrology Division in his talk about: A new vibe in material metrology – Raman spectroscopy
Join Eitan Oppenhaim, Nova’s President and Chief Executive Officer and Dror David, Chief Financial Officer, who will present at the 24th Needham Virtual Growth Conference on January 11th, 2022 at 9:15am EST.
Join Roy Shtainman, VP Product Marketing in his talk about: Spectral interferometry usage for advanced vertical integrations manufacturing process
Join Sang Hyun Han, Nova’s VP Strategic Marketing in his lecture about: A New Paradigm of Process Control Solutions for Advanced Semiconductor DevicesMonterey, California
Join Nova’s Sarah Okada, Sr. Product Manager, for a presentation about: Gate-All-Around Presents New Metrology Challenges and Opportunities
Join us in the 3rd Annual Needham Virtual Semiconductor and SemiCap 1×1 Conference One-on-one meeting requests can be made by contacting your Needham representative
We will hold virtual one-on-one meetings, on Wednesday, Aug. 24 and Thursday, Aug. 25
In-person with Eitan Oppenhaim, CEO & President Thursday, September 8th, at the Westin New York at Times Square. Fireside chat with Nova CEO & President is planned for 3:00 pm EDT on the same day.
Join Ilya Osherov, Nova’s Product Marketing Director, in his talk about: Spectral interferometry and VTS technology for advanced nodes manufacturing process metrology, in the Semiconductor Advanced Inspection and Metrology Forum. Click here to Join the forum: https://www.semicontaiwan.org/en/semiconductor-advanced-inspection-and-metrology%20-forum
Join Dr. Irene Popova, Nova’s CMD VP of Technology in her presentation: Increased use of chemical process control taking as a path to increased sustainability