Products Overview
Nova VERAFLEX®

Nova VERAFLEX®

Nova VERAFLEX® is the industry standard for combined XPS and XRF composition and thickness materials characterization. Generational increases in X-ray flux lead to the highest precision and throughput available for in-line XPS. With hundreds of installed systems over 5 model generations, Nova VERAFLEX® is ideal for fully automated process control to maximize yield while maintaining precise performance.

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