The Insight to Transform- The Foresight to Predict
Dimensional Metrology
Nova’s advanced multidisciplinary dimensional metrology technologies combine complex opto-mechanical hardware with advanced optics and cutting-edge algorithms to continuously innovate for effective process control throughout the semiconductor fabrication life cycle                                        
                                        
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                                    Materials Metrology
Nova’s highly sensitive metrology and advanced process control technologies provide unique, scalable solutions to address the semiconductor industry’s materials metrology challenges.                                        
                                        
                                    02
                                    Chemical Metrology
Nova leverages a wide range of advanced chemical metrology analysis techniques designed to measure and analyze multiple metals and compounds of increasing complexity.                                         
                                        
                                    03
                                    Modeling Software
Nova’s industry-leading software solutions deliver breakthrough performance with uncompromising accuracy and productivity, for the most complex challenges in 3D structures. Our cutting-edge modeling and fleet technology solutions feature the most comprehensive algorithmic, big data, and computational infrastructure suite, combining physical and AI-adjacent capabilities.                                        
                                        
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                                        Dimensional Metrology                                    
                                
                                        Materials Metrology                                     
                                
                                        Chemical Metrology                                    
                                
                                        Modeling Software                                     
                                Dimensional Metrology
                                     Nova’s advanced multidisciplinary dimensional metrology technologies combine complex opto-mechanical hardware with advanced optics and cutting-edge algorithms to continuously innovate for effective process control throughout the semiconductor fabrication life cycle
                                     Technologies
                                    Materials Metrology 
                                     Nova’s highly sensitive metrology and advanced process control technologies provide unique, scalable solutions to address the semiconductor industry’s materials metrology challenges.
                                     Technologies
                                    Chemical Metrology
                                     Nova leverages a wide range of advanced chemical metrology analysis techniques designed to measure and analyze multiple metals and compounds of increasing complexity. 
                                     Technologies
                                    Modeling Software 
                                     Nova’s industry-leading software solutions deliver breakthrough performance with uncompromising accuracy and productivity, for the most complex challenges in 3D structures. Our cutting-edge modeling and fleet technology solutions feature the most comprehensive algorithmic, big data, and computational infrastructure suite, combining physical and AI-adjacent capabilities.
                                     Technologies
                                    Complex Challenges- Clear Cut Solutions
Dimensional Metrology
Nova offers inline optical integrated and standalone metrology platforms. Our metrology product portfolio combined with proprietary modeling algorithms and machine learning software deliver unique measurement capabilities for the most advanced semiconductor technology nodes.
                                    
                                Materials Metrology
Nova is a market leader for innovative thin film metrology and process control technologies. We develop highly sensitive in-line materials metrology solutions on high productivity platforms, thereby enabling critical metrology solutions to be closer to a semiconductor fab’s process and integration needs.
                                    
                                Chemical Metrology
Nova offers a market-leading portfolio of advanced, open and flexible chemical metrology platforms for backend wafer-level packaging and front-end dual-damascene process steps. Our portfolio helps manufacturers ensure high-quality electroplating processes by carrying out chemical analysis and replenishment in real time.
                                    
                                Software Solutions
Nova’s software solutions combine top notch algorithms in the field of Artificial Intelligence and machine learning. Our comprehensive portfolio provides customers with a complete modeling and application development solution designed for complex 3D and HAR structures in the most advanced logic and memory technology nodes.
                                    
                                Our Product Families
                        
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                                    Your Time to Shine
                    At Nova, you have the power to move the needle at the forefront of technology. You’ll work in good company at a leading metrology innovator, where “disruptive” is the keyword. Your personal impact makes a world of difference, and when you grow- we all grow, together.
                
                
            Emerging Process Insight Trailblazers
31
                            Years in Operation 
                        500+
                            Patents
                        1400
                            Employees
                        6400
                            Installed Base
                         
                                             
                                             
                                             
                                             
                                                     
                                                    